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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
Links |
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Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Amelinckx, S.; Ravazi, F.S.; Habermeier, H.-U. |
Structure and microstructure of La1-xSrxMnO3 (x=0.16) films grown on a SrTiO3(110) substrate |
2001 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
81 |
12 |
UA library record; WoS full record; WoS citing articles |
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Salluzzo, M.; Aruta, C.; Maggio-Aprile, I.; Fischer, Ø.; Bals, S.; Zegenhagen, J. |
Growth of R1+xBa2-xCu3O7-\delta epitaxial films investigated by in situ scanning tunneling microscopy |
2001 |
Physica status solidi: A: applied research |
186 |
17 |
UA library record; WoS full record; WoS citing articles |
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Gottschalck Andersen, L.; Bals, S.; Van Tendeloo, G.; Poulsen, H.F.; Liu, Y.L. |
Transmission electron microscopy investigation of Bi-2223/Ag tapes |
2001 |
Physica: C : superconductivity |
353 |
13 |
UA library record; WoS full record; WoS citing articles |
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Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. |
Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy |
2001 |
Materials science in semiconductor processing |
4 |
|
UA library record; WoS full record |
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Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
2001 |
Materials science in semiconductor processing |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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