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Author |
Hoornaert, S.; Treiger, B.; Van Grieken, R.; Valkovic, V. |
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Title |
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level |
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H3 Book chapter |
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Year |
1996 |
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Abbreviated Journal |
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Pages |
29-49b
T2 - Reference materials for microanalytica |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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UA library record |
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no |
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Call Number |
UA @ admin @ c:irua:14681 |
Serial |
7874 |
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Author |
Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R. |
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Title |
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level |
Type |
A1 Journal article |
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Year |
1998 |
Publication |
Microchimica acta |
Abbreviated Journal |
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Volume |
128 |
Issue |
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Pages |
207-213 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000071438000010 |
Publication Date |
2005-02-26 |
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ISSN |
0026-3672; 1436-5073 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:20960 |
Serial |
7873 |
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| Permanent link to this record |
