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  Author (up) Title Year Publication Volume Times cited Additional Links Links
van der Snickt, G.; Dubois, H.; Sanyova, J.; Legrand, S.; Coudray, A.; Glaude, C.; Postec, M.; van Espen, P.; Janssens, K. Large-area elemental imaging reveals Van Eyck's original paint layers on the Ghent altarpiece (1432), rescoping its conservation treatment 2017 Angewandte Chemie: international edition in English 56 11 UA library record; WoS full record; WoS citing articles pdf doi
Van Echelpoel, R.; de Jong, M.; Daems, D.; van Espen, P.; De Wael, K. Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications 2021 Talanta 233 UA library record; WoS full record; WoS citing articles pdf url doi
van Espen, P.; Janssens, K. Spectrum evaluation 1992 UA library record
van Espen, P.; Janssens, K.; Nobels, J. AXIL-PC, software for the analysis of complex-x-ray spectra 1986 Chemometrics and intelligent laboratory systems 1 UA library record; WoS full record; WoS citing articles pdf doi
van Espen, P.; Van 't dack, L.; Adams, F.; Van Grieken, R. Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence 1979 Analytical chemistry 51 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Janssens, K.; van Espen, P.; Injuk, J.; Padilla, R.; Vittiglio, G.; Potgieter, J.H. Novel quantitative procedures for in-situ X-ray fluorescence analysis 2005 UA library record
van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source 2000 European mass spectrometry 6 10 UA library record; WoS full record; WoS citing articles doi
Vandevijvere, M.; Van de Voorde, L.; Caen, J.; van Espen, P.; Vekemans, B.; Vincze, L.; Schalm, O. Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium) 2013 UA library record
Vanmeert, F.; De Meyer, S.; Gestels, A.; Clerici, E.A.; Deleu, N.; Legrand, S.; Van Espen, P.; Van der Snickt, G.; Alfeld, M.; Dik, J.; Monico, L.; De Nolf, W.; Cotte, M.; Gonzalez, V.; Saverwyns, S.; Depuydt-Elbaum, L.; Janssens, K. Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods 2022 UA library record pdf doi
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments 1994 X-ray spectrometry 23 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis 1997 Analytical chemistry 69 6 UA library record; WoS full record; WoS citing articles doi
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