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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1999 |
Journal of analytical atomic spectrometry |
14 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
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|
UA library record |
|
|
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Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
|
