toggle visibility
Search within Results:
Display Options:
Number of records found: 3047

Select All    Deselect All
 | 
Citations
 | 
   print
Model-based quantification of EELS: is standardless quantification possible?”.Verbeeck J, Bertoni G, Microchimica acta 161, 439 (2008). http://doi.org/10.1007/s00604-008-0948-7
toggle visibility
Model-based quantification of EELS spectra: treating the effect of correlated noise”. Verbeeck J, Bertoni G, Ultramicroscopy 108, 74 (2008). http://doi.org/10.1016/j.ultramic.2007.03.004
toggle visibility
A holographic biprism as a perfect energy filter?”.Verbeeck J, Bertoni G, Lichte H, Ultramicroscopy 111, 887 (2011). http://doi.org/10.1016/j.ultramic.2011.01.042
toggle visibility
The Fresnel effect of a defocused biprism on the fringes in inelastic holography”. Verbeeck J, Bertoni G, Schattschneider P, Ultramicroscopy T2 –, 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108, 263 (2008). http://doi.org/10.1016/j.ultramic.2007.06.007
toggle visibility
Shaping electron beams for the generation of innovative measurements in the (S)TEM”. Verbeeck J, Guzzinati G, Clark L, Juchtmans R, Van Boxem R, Tian H, Béché, A, Lubk A, Van Tendeloo G, Comptes rendus : physique 15, 190 (2014). http://doi.org/10.1016/j.crhy.2013.09.014
toggle visibility
Optimal aperture sizes and positions for EMCD experiments”. Verbeeck J, Hébert, Rubino S, Novák P, Rusz J, Houdellier F, Gatel C, Schattschneider P, Ultramicroscopy 108, 865 (2008). http://doi.org/10.1016/j.ultramic.2008.02.007
toggle visibility
Fe and Co nanowires and nanotubes synthesized by template electrodeposition: a HRTEM and EELS study”. Verbeeck J, Lebedev OI, Van Tendeloo G, Cagnon L, Bougerol C, Tourillon T, Journal of the electrochemical society 150, E468 (2003). http://doi.org/10.1149/1.1601230
toggle visibility
SrTiO3(100)/(LaMnO3)m(SrMnO3)n layered heterostructures: a combined EELS and TEM study”. Verbeeck J, Lebedev OI, Van Tendeloo G, Mercey B, Physical review : B : condensed matter and materials physics 66, 184426 (2002). http://doi.org/10.1103/PhysRevB.66.184426
toggle visibility
Electron energy-loss spectroscopy study of a (LaMnO3)8(SrMnO3)4 heterostructure”. Verbeeck J, Lebedev OI, Van Tendeloo G, Silcox J, Mercey B, Hervieu M, Haghiri-Gosnet AM, Applied physics letters 79, 2037 (2001). http://doi.org/10.1063/1.1403316
toggle visibility
Image simulation of high resolution energy filtered TEM images”. Verbeeck J, Sc hattschneider P, Rosenauer A, Ultramicroscopy 109, 350 (2009). http://doi.org/10.1016/j.ultramic.2009.01.003
toggle visibility
Atomic scale electron vortices for nanoresearch”. Verbeeck J, Schattschneider P, Lazar S, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Van Tendeloo G, Applied physics letters 99, 203109 (2011). http://doi.org/10.1063/1.3662012
toggle visibility
A new way of producing electron vortex probes for STEM”. Verbeeck J, Tian H, Béché, A, Ultramicroscopy 113, 83 (2012). http://doi.org/10.1016/j.ultramic.2011.10.008
toggle visibility
Production and application of electron vortex beams”. Verbeeck J, Tian H, Schattschneider P, Nature 467, 301 (2010). http://doi.org/10.1038/nature09366
toggle visibility
How to manipulate nanoparticles with an electron beam?”.Verbeeck J, Tian H, Van Tendeloo G, Advanced materials 25, 1114 (2013). http://doi.org/10.1002/adma.201204206
toggle visibility
Model based quantification of EELS spectra”. Verbeeck J, Van Aert S, Ultramicroscopy 101, 207 (2004). http://doi.org/10.1016/j.ultramic.2004.06.004
toggle visibility
Model-based quantification of EELS spectra: including the fine structure”. Verbeeck J, Van Aert S, Bertoni G, Ultramicroscopy 106, 976 (2006). http://doi.org/10.1016/j.ultramic.2006.05.006
toggle visibility
Computational aspects in quantitative EELS”. Verbeeck J, Van Aert S, Zhang L, Haiyan T, Schattschneider P, Rosenauer A, Microscopy and microanalysis 16, 240 (2010). http://doi.org/10.1017/S143192761005511X
toggle visibility
Plasmon holographic experiments: theoretical framework”. Verbeeck J, van Dyck D, Lichte H, Potapov P, Schattschneider P, Ultramicroscopy 102, 239 (2005). http://doi.org/10.1016/j.ultramic.2004.10.005
toggle visibility
Energy-filtered transmission electron microscopy: an overview”. Verbeeck J, van Dyck D, Van Tendeloo G, Spectrochimica acta: part B : atomic spectroscopy 59, 1529 (2004). http://doi.org/10.1016/j.sab.2004.03.020
toggle visibility
Tubular fullerenes inside carbon nanotubes : optimal molecular orientation versus tube radius”. Verberck B, Tarakina NV, European physical journal : B : condensed matter and complex systems 80, 355 (2011). http://doi.org/10.1140/epjb/e2011-10952-1
toggle visibility
A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction”. Verbist K, Lebedev OI, Van Tendeloo G, Tafuri F, Granozio FM, Di Chiara A, Bender H, Applied physics letters 74, 1024 (1999). http://doi.org/10.1063/1.123443
toggle visibility
Low- or high-angle Ar ion-beam etching to create ramp-type Josephson junctions”. Verbist K, Lebedev OI, Van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA, Superconductor science and technology 9, 978 (1996). http://doi.org/10.1088/0953-2048/9/11/009
toggle visibility
Study of ramp-type Josephson junctions by HREM”. Verbist K, Lebedev OI, Van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA, Electronic Applications, Vol 2: Large Scale And Power Applications , 49 (1997)
toggle visibility
Ga segregation in DyBa2Cu3O7-\delta/PrBa2Cu3-xGaxO7-\delta/DyBa2Cu3O7-\delta ramp-type Josephson junctions”. Verbist K, Lebedev OI, Van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA, Rogalia H, Applied physics letters 70, 1167 (1997)
toggle visibility
Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties”. Verbist K, Lebedev OI, Verhoeven MAJ, Winchern R, Rijnders AJHM, Blank DHA, Tafuri F, Bender H, Van Tendeloo G, Superconductor science and technology 11, 13 (1998). http://doi.org/10.1088/0953-2048/11/1/004
toggle visibility
Molecular beam epitaxy and microstructural study of La2-xSr1+xCu2O6+y thin films”. Verbist K, Milat O, Van Tendeloo G, Arrouy F, Williams EJ, Rossel C, Machler E, Locquet J-P, Physical review : B : condensed matter and materials physics 56, 853 (1997)
toggle visibility
Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta”. Verbist K, Tafuri F, Granozio FM, Di Chiara S, Van Tendeloo G, Electron Microscopy 1998, Vol 2: Materials Science 1 , 593 (1998)
toggle visibility
Microstructure of artificial [100] 45°, twist grain boundaries in YBa2Cu3O7-”. Verbist K, Tafuri F, Miletto Granozio F, di Chiara S, Van Tendeloo G, Electron microscopy: vol. 2 , 593 (1998)
toggle visibility
TEM study of YBa2Cu3O7-x thin films with Zn and Fe”. Verbist K, Van Tendeloo G, Ye M, Mehbod M, Deltour R, Physica: C : superconductivity 235, 663 (1994). http://doi.org/10.1016/0921-4534(94)91555-5
toggle visibility
Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy”. Verbist K, Van Tendeloo G, Ye M, Schroeder J, Mehbod M, Deltour R, Microscopy, microanalysis, microstructures 7, 17 (1996). http://doi.org/10.1051/mmm:1996104
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: