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| Record | |||||
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| Author | Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. | ||||
| Title | Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer | Type | A1 Journal article | ||
| Year | 2002 | Publication | X-ray spectrometry | Abbreviated Journal  |
X-Ray Spectrom |
| Volume | 31 | Issue | 1 | Pages | 87-91 |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000173653400016 | Publication Date | 2002-10-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0049-8246 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.298 | Times cited | 12 | Open Access | |
| Notes | Approved | Most recent IF: 1.298; 2002 IF: 1.574 | |||
| Call Number | UA @ admin @ c:irua:36670 | Serial | 5529 | ||
| Permanent link to this record | |||||