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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Thirumalraj, alamurugan; Palanisamy, S.; Chen, S.-M.; De Wael, K. |
A graphene/gelatin composite material for the entrapment of hemoglobin for bioelectrochemical sensing applications |
2016 |
Journal of the electrochemical society |
163 |
9 |
UA library record; WoS full record; WoS citing articles |
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McCalla, E.; Prakash, A.S.; Berg, E.; Saubanere, M.; Abakumov, A.M.; Foix, D.; Klobes, B.; Sougrati, M.T.; Rousse, G.; Lepoivre, F.; Mariyappan, S.; Doublet, M.L.; Gonbeau, D.; Novak, P.; Van Tendeloo, G.; Hermann, R.P.; Tarascon, J.M.; |
Reversible Li-intercalation through oxygen reactivity in Li-rich Li-Fe-Te oxide materials |
2015 |
Journal of the electrochemical society |
162 |
23 |
UA library record; WoS full record; WoS citing articles |
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Vassiliev, S.Y.; Laurinavichute, V.K.; Abakumov, A.M.; Govorov, V.A.; Bendovskii, E.B.; Turner, S.; Filatov, A.Y.; Tarasovskii, V.P.; Borzenko, A.G.; Alekseeva, A.M.; Antipov, E.V. |
Microstructural aspects of the degradation behavior of SnO2-based anodes for aluminum electrolysis |
2010 |
Journal of the electrochemical society |
157 |
3 |
UA library record; WoS full record; WoS citing articles |
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de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy |
2004 |
Journal of the electrochemical society |
151 |
13 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Cagnon, L.; Bougerol, C.; Tourillon, T. |
Fe and Co nanowires and nanotubes synthesized by template electrodeposition: a HRTEM and EELS study |
2003 |
Journal of the electrochemical society |
150 |
41 |
UA library record; WoS full record; WoS citing articles |
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Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G. |
Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures |
2001 |
Journal of the electrochemical society |
148 |
13 |
UA library record; WoS full record; WoS citing articles |
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de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces |
2000 |
Journal of the electrochemical society |
147 |
14 |
UA library record; WoS full record; WoS citing articles |
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