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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Verbist, K.; Tafuri, F.; Miletto Granozio, F.; di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45° twist grain boundaries in YBa2Cu3O7- |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. |
HREM investigation of La1-xCaxMnO3- thin films |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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