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\bibitem{Deylgat_etal2023} {\textquotedblleft}\textit{Quantum transport study of contact resistance of edge- and top-contacted two-dimensional materials}{\textquotedblright}. Deylgat E, Chen E, Sor{\'e}e B, Vandenberghe WG, International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 -- International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 27-29, 2023, Kobe, Japan , 45 (2023).   http://doi.org/10.23919/SISPAD57422.2023.10319537

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