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\bibitem{Poulain_etal2022} {\textquotedblleft}\textit{Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism}{\textquotedblright}. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials \textbf{4}, 2718 (2022).   http://doi.org/10.1021/ACSAELM.2C00230

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