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\bibitem{Smit_etal2004} {\textquotedblleft}\textit{Confocal μ-XRF depth analysis of paint layers}{\textquotedblright}. {\v S}mit {\v Z}, Janssens K, Proost K, Langus I, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms \textbf{219}, 35 (2004).   http://doi.org/10.1016/J.NIMB.2004.01.024

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