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\bibitem{Gauquelin_etal2018} {\textquotedblleft}\textit{Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_{2}$Cu$_{3}$O$_{7-\delta}$ thin films}{\textquotedblright}. Gauquelin N, Zhang H, Zhu G, Wei JYT, Botton GA, AIP advances \textbf{8}, 055022 (2018).   http://doi.org/10.1063/1.5011761

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