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\bibitem{Cooper_etal2012} {\textquotedblleft}\textit{Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy}{\textquotedblright}. Cooper D, Le Royer C, B{\'e}ch{\'e} A, Rouvi{\`e}re J-L, Applied Physics Letters \textbf{100}, 233121 (2012).   http://doi.org/10.1063/1.4723572

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