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\bibitem{Jalabert_etal2012} {\textquotedblleft}\textit{Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering}{\textquotedblright}. Jalabert D, Pelloux-Gervais D, B{\'e}ch{\'e} A, Hartmann JM, Gergaud P, Rouvi{\`e}re JL, Canut B, Physica Status Solidi A-Applications And Materials Science \textbf{209}, 265 (2012).   http://doi.org/10.1002/PSSA.201127502

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