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\bibitem{Moors_etal2017} {\textquotedblleft}\textit{Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering}{\textquotedblright}. Moors K, Sor{\'e}e B, Magnus W, Microelectronic engineering \textbf{167}, 37 (2017).   http://doi.org/10.1016/J.MEE.2016.10.015

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