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\bibitem{Conard_etal1999} {\textquotedblleft}\textit{XPS and TOFSIMS studies of shallow Si/Si$_{1-x}$Ge$_{x}$/Si layers}{\textquotedblright}. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films \textbf{343/344}, 583 (1999).   http://doi.org/10.1016/S0040-6090(99)00122-4

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