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\bibitem{Montoya_etal2008} {\textquotedblleft}\textit{Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO$_{3}$/SrTiO$_{3}$ multilayers prepared by focused ion beam}{\textquotedblright}. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy \textbf{231}, 359 (2008).   http://doi.org/10.1111/j.1365-2818.2008.02055.x

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