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\bibitem{Lujan_etal2005} {\textquotedblleft}\textit{A new method to calculate leakage current and its applications for sub-45nm MOSFETs}{\textquotedblright}.  Lujan GS, Magnus W, Soree B, Pourghaderi MA, Veloso A, van Dal MJH, Lauwers A, Kubicek S, De Gendt S, Heyns M, De Meyer K,  Solid-State Device Research (ESSDERC), European Conference
T2 -- ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France. Ieee, S.l., page 489 (2005).

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