1. “Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy”. De Backer A, Zhang Z, van den Bos KHW, Bladt E, Sánchez‐Iglesias A, Liz‐Marzán LM, Nellist PD, Bals S, Van Aert S, Small methods , 2200875 (2022).   http://doi.org/10.1002/smtd.202200875