1. “Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF”. Kempenaers L, Janssens K, Jochum KP, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Adams F, Journal of analytical atomic spectrometry 18, 350 (2003).   http://doi.org/10.1039/B212196D