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\bibitem{Frangis_etal1996} {\textquotedblleft}\textit{Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate}{\textquotedblright}. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Applied surface science \textbf{102}, 163 (1996).   http://doi.org/10.1016/0169-4332(96)00040-2

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