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\bibitem{Adelmann_etal2018} {\textquotedblleft}\textit{Alternative Metals: from ab initio Screening to Calibrated Narrow Line Models}{\textquotedblright}. Adelmann C, Sankaran K, Dutta S, Gupta A, Kundu S, Jamieson G, Moors K, Pinna N, Ciofi I, Van Elshocht S, Bommels J, Boccardi G, Wilson CJ, Pourtois G, Tokei Z, Proceedings of the IEEE ... International Interconnect Technology Conference
T2 -- IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA , 154 (2018).   http://doi.org/10.1109/IITC.2018.8456484

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