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\bibitem{Dewael_etal2021} {\textquotedblleft}\textit{Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt}{\textquotedblright}. De wael A, De Backer A, Lobato I, Van Aert S, Ultramicroscopy , 113391 (2021).   http://doi.org/10.1016/j.ultramic.2021.113391

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