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\bibitem{Do_etal2021} {\textquotedblleft}\textit{Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors}{\textquotedblright}. Do MT, Gauquelin N, Nguyen MD, Blom F, Verbeeck J, Koster G, Houwman EP, Rijnders G, Apl Materials \textbf{9}, 021113 (2021).   http://doi.org/10.1063/5.0038719

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