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\bibitem{Ding_etal2020} {\textquotedblleft}\textit{TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates}{\textquotedblright}. Ding L, Raskin J-P, Lumbeeck G, Schryvers D, Idrissi H, Materials Characterization \textbf{161}, 110174 (2020).   http://doi.org/10.1016/J.MATCHAR.2020.110174

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