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\bibitem{Ignatova_etal2004} {\textquotedblleft}\textit{Depth profiling of ZrO$_{2}$/SiO$_{2}$/Si stacks : a TOF-SIMS and computer simulation study}{\textquotedblright}. Ignatova VA, Conard T, M{\"o}ller W, Vandervorst W, Gijbels R, Applied surface science \textbf{231/232}, 603 (2004).   http://doi.org/10.1016/j.apsusc.2004.03.121

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