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\bibitem{Lumbeeck_etal2020} {\textquotedblleft}\textit{Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy}{\textquotedblright}. Lumbeeck G, Delvaux A, Idrissi H, Proost J, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films \textbf{707}, 138076 (2020).   http://doi.org/10.1016/j.tsf.2020.138076

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