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\bibitem{Prabhakara_etal2019} {\textquotedblleft}\textit{Strain measurement in semiconductor FinFET devices using a novel moir{\'e} demodulation technique}{\textquotedblright}. Prabhakara V, Jannis D, B{\'e}ch{\'e} A, Bender H, Verbeeck J, Semiconductor science and technology  (2019).   http://doi.org/10.1088/1361-6641/ab5da2

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