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\bibitem{DeGryse_etal1999} {\textquotedblleft}\textit{Accurate infrared absorption measurement of interstitial and precipitated oxygen in p$^{+}$ silicon wafers}{\textquotedblright}. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering \textbf{45}, 277 (1999).   http://doi.org/10.1016/S0167-9317(99)00180-X

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