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\bibitem{VanAert_etal2001} {\textquotedblleft}\textit{High resolution electron microscopy from imaging towards measuring}{\textquotedblright}. Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D  ... IEEE International Instrumentation and Measurement Technology Conference
T2 -- Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3. Ieee, page 2081 (2001).

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