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\bibitem{Cooper_etal2016} {\textquotedblleft}\textit{Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope}{\textquotedblright}. Cooper D, Denneulin T, Bernier N, B{\'e}ch{\'e} A, Rouvi{\`e}re J-L, Micron \textbf{80}, 145 (2016).   http://doi.org/10.1016/J.MICRON.2015.09.001

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