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\bibitem{Moors_etal2015} {\textquotedblleft}\textit{Modeling and tackling resistivity scaling in metal nanowires}{\textquotedblright}. Moors K, Sor{\'e}e B, Magnus W, International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 -- International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC , 222 (2015)

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