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\bibitem{Katti_etal2011} {\textquotedblleft}\textit{Temperature-dependent modeling and characterization of through-silicon via capacitance}{\textquotedblright}. Katti G, Stucchi M, Velenis D, Sor{\'e}e B, de Meyer K, Dehaene W, IEEE electron device letters \textbf{32}, 563 (2011).   http://doi.org/10.1109/LED.2011.2109052

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