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\bibitem{deGryse_etal2001} {\textquotedblleft}\textit{Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM}{\textquotedblright}. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter
T2 -- 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY \textbf{308}, 294 (2001).   http://doi.org/10.1016/S0921-4526(01)00801-8

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