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\bibitem{Toledano-Luque_etal2014} {\textquotedblleft}\textit{Superior reliability of junctionless pFinFETs by reduced oxide electric field}{\textquotedblright}. Toledano-Luque M, Matagne P, Sibaja-Hernandez A, Chiarella T, Ragnarsson L-A, Sor{\'e}e B, Cho M, Mocuta A, Thean A, IEEE electron device letters \textbf{35}, 1179 (2014).   http://doi.org/10.1109/LED.2014.2361769

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