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\bibitem{Vanhellemont_etal1993} {\textquotedblleft}\textit{Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry}{\textquotedblright}.  Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehl{\'e} JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science
T2 -- SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE \textbf{63}, 45 (1993).   http://doi.org/10.1016/0169-4332(93)90062-G

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