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\bibitem{Xu_etal2014} {\textquotedblleft}\textit{Multilayer graphene, Moire patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC}{\textquotedblright}.  Xu P, Qi D, Schoelz JK, Thompson J, Thibado PM, Wheeler VD, Nyakiti LO, Myers-Ward RL, Eddy CR, Gaskill DK, Neek-Amal M, Peeters FM;, Carbon \textbf{80}, 75 (2014).   http://doi.org/10.1016/j.carbon.2014.08.028

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