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\bibitem{Kao_etal2012} {\textquotedblleft}\textit{Modeling the impact of junction angles in tunnel field-effect transistors}{\textquotedblright}. Kao K-H, Verhulst AS, Vandenberghe WG, Sor{\'e}e B, Groeseneken G, De Meyer K, Solid state electronics \textbf{69}, 31 (2012).   http://doi.org/10.1016/j.sse.2011.10.032

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