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\bibitem{Frangis_etal1998} {\textquotedblleft}\textit{High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial Si$_{x}$Ge$_{1-x}$ alloys produced through laser induced processing}{\textquotedblright}. Frangis N, van Landuyt J, Lartiprete R, Martelli S, Borsella E, Chiussi S, Castro J, Leon B, Applied physics letters \textbf{72}, 2877 (1998).   http://doi.org/10.1063/1.121487

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