|  | Author | Title | Year  | Publication | Volume | Times cited | Additional Links | Links | 
	|  | van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. | The influence of crystal thickness on the image tone | 2003 | Journal of imaging science | 47 |  | UA library record; WoS full record; WoS citing articles |  | 
	|  | Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. | Microstructural mechanism of development in photothermographic materials | 2003 | The journal of imaging science and technology | 47 |  | UA library record; WoS full record; WoS citing articles |  | 
	|  | van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. | A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals | 2001 | The journal of imaging science and technology | 45 |  | UA library record; WoS full record; WoS citing articles |  | 
	|  | van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. | Influence of twinning on the morphology of AgBr and AgCl microcrystals | 2001 | The journal of imaging science and technology | 45 |  | UA library record; WoS full record; WoS citing articles |  | 
	|  | Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. | Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study | 2000 |  |  |  | UA library record; WoS full record; |  | 
	|  | Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. | The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals | 2000 |  |  |  | UA library record; WoS full record; |  | 
	|  | de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. | Characterization of AgxAuy nano particles by TEM and STEM | 1999 | Journal of analytical atomic spectrometry | 14 | 2 | UA library record; WoS full record; WoS citing articles |   | 
	|  | van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. | Defects and growth mechanisms of AgCl(100) tabular crystals | 1998 | Journal of crystal growth | 187 | 8 | UA library record; WoS full record; WoS citing articles |   | 
	|  | van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. | Defect related growth of tabular AgCl(100) crystals: a TEM study | 1998 |  |  |  | UA library record; WoS full record; |  | 
	|  | van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. | Defects in AgCl and AgBr(100) tabular crystals studied by TEM | 1998 |  |  |  | UA library record |  | 
	|  | de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. | Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 | 1998 |  |  |  | UA library record |  | 
	|  | Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. | Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy | 1997 | Journal of microscopy | 188 | 6 | UA library record; WoS full record; WoS citing articles |  | 
	|  | Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. | A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals | 1996 | The journal of imaging science and technology | 40 | 4 | UA library record; WoS full record; WoS citing articles |  | 
	|  | Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. | EM study of sensitisation of silver halide grains | 1994 | Icem | 13 |  | UA library record; WoS full record; |  |