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  Author Title Year (down) Publication Volume Times cited Additional Links Links
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. The influence of crystal thickness on the image tone 2003 Journal of imaging science 47 UA library record; WoS full record; WoS citing articles
Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. Microstructural mechanism of development in photothermographic materials 2003 The journal of imaging science and technology 47 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. Influence of twinning on the morphology of AgBr and AgCl microcrystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study 2000 UA library record; WoS full record;
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals 2000 UA library record; WoS full record;
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. Characterization of AgxAuy nano particles by TEM and STEM 1999 Journal of analytical atomic spectrometry 14 2 UA library record; WoS full record; WoS citing articles doi
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. Defects and growth mechanisms of AgCl(100) tabular crystals 1998 Journal of crystal growth 187 8 UA library record; WoS full record; WoS citing articles doi
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. Defect related growth of tabular AgCl(100) crystals: a TEM study 1998 UA library record; WoS full record;
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. Defects in AgCl and AgBr(100) tabular crystals studied by TEM 1998 UA library record
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 1998 UA library record
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals 1996 The journal of imaging science and technology 40 4 UA library record; WoS full record; WoS citing articles
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. EM study of sensitisation of silver halide grains 1994 Icem 13 UA library record; WoS full record;
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