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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Spolnik, Z.M.; Claes, M.; Van Grieken, R.E.; de Bokx, P.K.; Urbach, H.P. |
Quantification in grazing-emission X-ray fluorescence spectrometry |
1999 |
Spectrochimica acta: part B : atomic spectroscopy |
54 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Tsuji, K.; Takenaka, H.; Wagatsuma, K.; de Bokx, P.K.; Van Grieken, R.E. |
Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles |
1999 |
Spectrochimica acta: part B : atomic spectroscopy |
54 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
de Gendt, S.; Kenis, K.; Mertens, P.W.; Heyns, M.M.; Claes, M.; Van Grieken, R.E.; Bailleul, A.; Knotter, M.; de Bokx, P.K. |
Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements |
1996 |
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|
|
UA library record |
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