|  | Author | Title | Year  | Publication | Volume | Times cited | Additional Links | Links | 
	|  | Claes, M.; de Bokx, P.; Van Grieken, R. | Progress in laboratory grazing emission X-ray fluorescence spectrometry | 1999 | X-ray spectrometry | 28 |  | UA library record; WoS full record; WoS citing articles |   | 
	|  | Spolnik, Z.M.; Claes, M.; Van Grieken, R.E.; de Bokx, P.K.; Urbach, H.P. | Quantification in grazing-emission X-ray fluorescence spectrometry | 1999 | Spectrochimica acta: part B : atomic spectroscopy | 54 |  | UA library record; WoS full record; WoS citing articles |   | 
	|  | Tsuji, K.; Takenaka, H.; Wagatsuma, K.; de Bokx, P.K.; Van Grieken, R.E. | Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles | 1999 | Spectrochimica acta: part B : atomic spectroscopy | 54 |  | UA library record; WoS full record; WoS citing articles |   | 
	|  | Claes, M.; de Bokx, P.; Van Grieken, R. | Recent developments of laboratory grazing emission X-ray fluorescence spectrometry | 1999 |  |  |  | UA library record; WoS full record |  | 
	|  | Hołynska, B.; Olko, M.; Ostachowicz, B.; Ostachowicz, J.; Wegrzynek, D.; Claes, M.; Van Grieken, R.; de Bokx, P.; Kump, P.; Necemer, M. | Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques | 1998 | Fresenius' journal of analytical chemistry | 362 |  | UA library record; WoS full record; WoS citing articles |   | 
	|  | Claes, M.; de Bokx, P.; Willard, N.; Veny, P.; Van Grieken, R. | Optimization of sample preparation for grazing emission X-ray fluorescence in micro- and trace analysis applications | 1997 | Spectrochimica acta: part B : atomic spectroscopy | 52 |  | UA library record; WoS full record; WoS citing articles |   | 
	|  | de Gendt, S.; Kenis, K.; Mertens, P.W.; Heyns, M.M.; Claes, M.; Van Grieken, R.E.; Bailleul, A.; Knotter, M.; de Bokx, P.K. | Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements | 1996 |  |  |  | UA library record |  |