| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
|
|
UA library record; WoS full record; |
|
|
|
Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Microanalysis of individual silver halide microcrystals |
1993 |
Scanning microscopy |
7 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
|
|
|
Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Structural analysis of silver halide cubic microcrystals with epitaxial or conversion growths by STEM-EDX |
1992 |
Mikrochimica acta: supplementum |
12 |
|
UA library record |
|
|
|
Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Microanalysis of individual silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. |
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing |
1992 |
The journal of imaging science and technology |
36 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
|
