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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction 2010 Journal of physics : conference series 209 UA library record url doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
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