| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. |
Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles |
1989 |
X-ray spectrometry |
18 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Absorption correction in electron probe x-ray microanalysis of thin samples |
1986 |
Analytical chemistry |
58 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films |
1985 |
Analytical chemistry |
57 |
|
UA library record; WoS full record; WoS citing articles |
|
