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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs 1999 Journal of applied physics 85 6 UA library record; WoS full record; WoS citing articles doi
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