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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
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Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D. |
Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy |
2020 |
Thin solid films : an international journal on the science and technology of thin and thick films |
707 |
|
UA library record; WoS full record; WoS citing articles |
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Delvaux, A.; Lumbeeck, G.; Idrissi, H.; Proost, J. |
Effect of microstructure and internal stress on hydrogen absorption into Ni thin film electrodes during alkaline water electrolysis |
2020 |
Electrochimica Acta |
340 |
2 |
UA library record; WoS full record; WoS citing articles |
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Lumbeeck, G.; Idrissi, H.; Amin-Ahmadi, B.; Favache, A.; Delmelle, R.; Samaee, V.; Proost, J.; Pardoen, T.; Schryvers, D. |
Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films |
2018 |
Journal Of Applied Physics |
124 |
2 |
UA library record; WoS full record; WoS citing articles |
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van der Rest, A.; Idrissi, H.; Henry, F.; Favache, A.; Schryvers, D.; Proost, J.; Raskin, J.-P.; Van Overmeere, Q.; Pardoen, T. |
Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films |
2017 |
Acta materialia |
125 |
5 |
UA library record; WoS full record; WoS citing articles |
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Amin-Ahmadi, B.; Connétable, D.; Fivel, M.; Tanguy, D.; Delmelle, R.; Turner, S.; Malet, L.; Godet, S.; Pardoen, T.; Proost, J.; Schryvers, D.; Idrissi, H. |
Dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films |
2016 |
Acta materialia |
111 |
14 |
UA library record; WoS full record; WoS citing articles |
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Delmelle, R.; Amin-Ahmadi, B.; Sinnaeve, M.; Idrissi, H.; Pardoen, T.; Schryvers, D.; Proost, J. |
Effect of structural defects on the hydriding kinetics of nanocrystalline Pd thin films |
2015 |
International journal of hydrogen energy |
40 |
13 |
UA library record; WoS full record; WoS citing articles |
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Proost, J.; Blaffart, F.; Turner, S.; Idrissi, H. |
On the Origin of Damped Electrochemical Oscillations at Silicon Anodes (Revisited) |
2014 |
ChemPhysChem : a European journal of chemical physics and physical chemistry |
15 |
5 |
UA library record; WoS full record; WoS citing articles |
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Amin-Ahmadi, B.; Idrissi, H.; Delmelle, R.; Pardoen, T.; Proost, J.; Schryvers, D. |
High resolution transmission electron microscopy characterization of fcc -> 9R transformation in nanocrystalline palladium films due to hydriding |
2013 |
Applied physics letters |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
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Vanhumbeeck, J.-F.; Tian, H.; Schryvers, D.; Proost, J. |
Stress-assisted crystallisation in anodic titania |
2011 |
Corrosion science |
53 |
11 |
UA library record; WoS full record; WoS citing articles |
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