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Author Title Year (down) Publication Volume Times cited Additional Links
Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. The primary energy dependence of backscattered electron images up to 100 keV 1991 Scanning microscopy 5 3 UA library record; WoS full record; WoS citing articles