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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Quantification in XRF analysis of intermediate-thickness samples |
2002 |
|
|
|
UA library record |
|
|
|
Van Grieken, R.E.; Markowicz, A.A. |
Handbook of X-ray spectrometry |
2002 |
|
|
|
UA library record |
|
|
|
Markowicz, A.M.; Van Grieken, R.E. |
Quantification in XRF analysis of intermediate-thickness samples |
1992 |
|
|
|
UA library record |
|
|
|
Van Grieken, R.; Markowicz, A.; Veny, P. |
Current trends in the literature on X-ray emission spectrometry |
1991 |
X-ray spectrometry |
20 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1990 |
Analytical chemistry |
62 |
|
UA library record |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1988 |
Analytical chemistry |
60 |
|
UA library record |
|
|
|
Markowicz, A.; Storms, H.; Van Grieken, R. |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.; Storms, H.; Van Grieken, R. |
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples |
1986 |
X-ray spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1986 |
Analytical chemistry |
58 |
|
UA library record |
|
|
|
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Absorption correction in electron probe x-ray microanalysis of thin samples |
1986 |
Analytical chemistry |
58 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Grieken, R.; Markowicz, A.; Török, S. |
Energy-dispersive X-ray spectrometry : present state and trends |
1986 |
Fresenius' Zeitschrift für analytische Chemie |
324 |
|
UA library record |
|
|
|
Markowicz, A.; Raeymaekers, B.; Van Grieken, R.; Adams, F. |
Analytical electron microscopy of single particles |
1986 |
|
|
|
UA library record |
|
|
|
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Influence of sample thickness, excitation energy and geometry on particle size effects in XRF |
1985 |
X-ray spectrometry |
14 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Storms, H.M.; Van Grieken, R.E. |
Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films |
1985 |
Analytical chemistry |
57 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Markowicz, A.A.; Van Grieken, R.E. |
Atomic number correction in electron probe X-ray microanalysis of curved samples and particles |
1984 |
Analytical chemistry |
56 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Markowicz, A.A.; Van Grieken, R.E. |
X-ray spectrometry |
1984 |
Reviews in analytical chemistry |
56 |
|
UA library record |
|
|
|
Markowicz, A.; Van Dyck, P.; Van Grieken, R. |
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis |
1980 |
X-ray spectrometry |
9 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal |
1980 |
X-ray spectrometry |
9 |
|
UA library record; WoS full record; WoS citing articles |
|
