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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings |
2006 |
Applied surface science |
252 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) |
2006 |
Applied surface science |
252 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films |
2005 |
Rapid communications in mass spectrometry |
19 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques |
2005 |
Journal of mass spectrometry |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lenaerts, J.; van Vaeck, L.; Gijbels, R.; Van Luppen, J. |
Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry |
2004 |
Rapid communications in mass spectrometry |
18 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Lenaerts, J.; van Vaeck, L.; Gijbels, R. |
Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry |
2003 |
Rapid communications in mass spectrometry |
17 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
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Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. |
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals |
2003 |
Applied surface science |
203/204 |
7 |
UA library record; WoS full record; WoS citing articles |
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Lenaerts, J.; Verlinden, G.; Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS) |
2001 |
Fresenius' journal of analytical chemistry |
370 |
3 |
UA library record; WoS full record; WoS citing articles |
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|
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry |
2001 |
Langmuir |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
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Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
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UA library record |
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Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
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UA library record; WoS full record; |
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